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Information card for entry 7114068
Preview
| Coordinates | 7114068.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C16 H20 Al2 F4 N2 |
|---|---|
| Calculated formula | C16 H20 Al2 F4 N2 |
| SMILES | C[Al]1(C)[NH](c2cc(cc(c2)F)F)[Al](C)(C)[NH]1c1cc(cc(c1)F)F |
| Title of publication | Dialkyl aluminium amides: new reagents for the conversion of C???O into C???NR functionalitiesElectronic supplementary information (ESI) available: HRMS, 1H and 19F NMR data for 1???9. See http://www.rsc.org/suppdata/cc/b2/b203693b/ |
| Authors of publication | Gordon, John C.; Shukla, Piyush; Cowley, Alan H.; Jones, Jamie N.; Keogh, D. Webster; Scott, Brian L. |
| Journal of publication | Chemical Communications |
| Year of publication | 2002 |
| Journal issue | 22 |
| Pages of publication | 2710 |
| a | 14.241 ± 0.005 Å |
| b | 7.324 ± 0.002 Å |
| c | 18.512 ± 0.007 Å |
| α | 90° |
| β | 106.367 ± 0.006° |
| γ | 90° |
| Cell volume | 1852.6 ± 1.1 Å3 |
| Cell temperature | 203 ± 2 K |
| Ambient diffraction temperature | 203 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.078 |
| Residual factor for significantly intense reflections | 0.0596 |
| Weighted residual factors for significantly intense reflections | 0.1086 |
| Weighted residual factors for all reflections included in the refinement | 0.1129 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.395 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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