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Information card for entry 7114365
Preview
| Coordinates | 7114365.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C30 H58 Cl3 Hf N3 Si4 |
|---|---|
| Calculated formula | C30 H58 Cl3 Hf N3 Si4 |
| SMILES | [Hf]12(Cl)(Cl)(Cl)([N](C)(C)CC[N]1(C)C)[N](=C2[Si]([Si](C)(C)C)([Si](C)(C)C)[Si](C)(C)C)c1c(cccc1C)C.c1ccccc1 |
| Title of publication | First successful reaction of a silyl anion with hafnium tetrachloride |
| Authors of publication | Frank, Dieter; Baumgartner, Judith; Marschner, Christoph |
| Journal of publication | Chemical Communications |
| Year of publication | 2002 |
| Journal issue | 11 |
| Pages of publication | 1190 |
| a | 11.625 ± 0.002 Å |
| b | 12.164 ± 0.002 Å |
| c | 29.975 ± 0.006 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 4238.7 ± 1.3 Å3 |
| Cell temperature | 223 ± 2 K |
| Ambient diffraction temperature | 223 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 19 |
| Hermann-Mauguin space group symbol | P 21 21 21 |
| Hall space group symbol | P 2ac 2ab |
| Residual factor for all reflections | 0.0331 |
| Residual factor for significantly intense reflections | 0.0305 |
| Weighted residual factors for significantly intense reflections | 0.0786 |
| Weighted residual factors for all reflections included in the refinement | 0.0797 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.982 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7114365.html
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