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Information card for entry 7114972
Preview
| Coordinates | 7114972.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C48 H36 N4 O4 |
|---|---|
| Calculated formula | C48 H36 N4 O8 |
| SMILES | n1ccc(cc1)C1C(c2ccncc2)C(c2ccncc2)C1c1ccncc1.OC(=O)c1c2c(cccc2ccc1)C(=O)O.c1(c2c(cccc2ccc1)C(=O)O)C(=O)O |
| Title of publication | Exploiting modularity in template-controlled synthesis: a new linear template to direct reactivity within discrete hydrogen-bonded molecular assemblies in the solid state |
| Authors of publication | Papaefstathiou, Giannis S.; Kipp, Alex J.; MacGillivray, Leonard R. |
| Journal of publication | Chemical Communications |
| Year of publication | 2001 |
| Journal issue | 23 |
| Pages of publication | 2462 |
| a | 8.377 ± 0.002 Å |
| b | 11.294 ± 0.002 Å |
| c | 11.685 ± 0.002 Å |
| α | 99.45 ± 0.03° |
| β | 105.12 ± 0.03° |
| γ | 109.73 ± 0.03° |
| Cell volume | 965.1 ± 0.5 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0574 |
| Residual factor for significantly intense reflections | 0.0494 |
| Weighted residual factors for all reflections | 0.1296 |
| Weighted residual factors for significantly intense reflections | 0.1224 |
| Goodness-of-fit parameter for all reflections | 1.025 |
| Goodness-of-fit parameter for significantly intense reflections | 1.051 |
| Diffraction radiation wavelength | 0.7107 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7114972.html
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Users of the data should acknowledge the original authors of the
structural data.