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Information card for entry 7115155
Preview
| Coordinates | 7115155.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C28 H56 Cl2 N2 Pd2 Si6 |
|---|---|
| Calculated formula | C22.512 H45.024 Cl1.608 N1.608 Pd1.608 Si5.216 |
| Title of publication | The first structurally characterised σ-bonded organonickel(i) compound. Crystal structures of [Ni{C(SiMe3)2(SiMe2C5H4N-2)}(PPh3)], [Ni{C(SiMe3)(SiMe2C5H4N-2)(SiMe2O)}]2 and [Pd(μ-Cl){C(SiMe3)2(SiMe2C5H4N-2)}]2 |
| Authors of publication | Eaborn, Colin; Hill, Michael S.; Hitchcock, Peter B.; Smith, J. David |
| Journal of publication | Chemical Communications |
| Year of publication | 2000 |
| Journal issue | 8 |
| Pages of publication | 691 |
| a | 13.465 ± 0.005 Å |
| b | 23.39 ± 0.012 Å |
| c | 25.032 ± 0.009 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 7884 ± 6 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 61 |
| Hermann-Mauguin space group symbol | P b c a |
| Hall space group symbol | -P 2ac 2ab |
| Residual factor for all reflections | 0.1539 |
| Residual factor for significantly intense reflections | 0.0824 |
| Weighted residual factors for significantly intense reflections | 0.1875 |
| Weighted residual factors for all reflections included in the refinement | 0.2264 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.979 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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