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Information card for entry 7115655
Preview
| Coordinates | 7115655.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C54 H66 Cl2 N4 Si2 Zn2 |
|---|---|
| Calculated formula | C54 H66 Cl2 N4 Si2 Zn2 |
| SMILES | c1(ccccc1)[Si]1([N](=C(N1C(C)(C)C)c1ccccc1)C(C)(C)C)[Zn]1(c2ccccc2)[Cl][Zn](c2ccccc2)([Cl]1)[Si]1(c2ccccc2)[N](=C(N1C(C)(C)C)c1ccccc1)C(C)(C)C |
| Title of publication | Zinc-silylene complexes |
| Authors of publication | Sebastian Schafer; Ralf Koppe; Michael T. Gamer; Peter W. Roesky |
| Journal of publication | Chem.Commun. |
| Year of publication | 2014 |
| Journal volume | 50 |
| Pages of publication | 11401 |
| a | 12.479 ± 0.003 Å |
| b | 14.937 ± 0.003 Å |
| c | 14.85 ± 0.003 Å |
| α | 90° |
| β | 104.21 ± 0.03° |
| γ | 90° |
| Cell volume | 2683.3 ± 1.1 Å3 |
| Cell temperature | 200 ± 2 K |
| Ambient diffraction temperature | 200.15 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0377 |
| Residual factor for significantly intense reflections | 0.0265 |
| Weighted residual factors for significantly intense reflections | 0.0608 |
| Weighted residual factors for all reflections included in the refinement | 0.0628 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.92 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7115655.html
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