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Information card for entry 7117444
Preview
| Coordinates | 7117444.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C39 H37 Cl N2 O5 Si |
|---|---|
| Calculated formula | C39 H37 Cl N2 O5 Si |
| SMILES | [Cl-].[Si]1(c2cc(N(C)C)ccc2C(=c2ccc(=[N+](C)C)cc12)c1ccc(cc1)c1c2ccccc2cc2ccccc12)(C)C.O.O.O.O.O |
| Title of publication | The unprecedented J-aggregate formation of rhodamine moieties induced by 9-phenylanthracenyl substitution. |
| Authors of publication | Kim, Sooyeon; Fujitsuka, Mamoru; Tohnai, Norimitsu; Tachikawa, Takashi; Hisaki, Ichiro; Miyata, Mikiji; Majima, Tetsuro |
| Journal of publication | Chemical communications (Cambridge, England) |
| Year of publication | 2015 |
| Journal volume | 51 |
| Journal issue | 58 |
| Pages of publication | 11580 - 11583 |
| a | 9.8459 ± 0.0005 Å |
| b | 10.5371 ± 0.001 Å |
| c | 19.8151 ± 0.0017 Å |
| α | 94.748 ± 0.005° |
| β | 98.528 ± 0.005° |
| γ | 110.714 ± 0.005° |
| Cell volume | 1881.2 ± 0.3 Å3 |
| Cell temperature | 93 K |
| Ambient diffraction temperature | 93 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1156 |
| Residual factor for significantly intense reflections | 0.0958 |
| Weighted residual factors for significantly intense reflections | 0.3126 |
| Weighted residual factors for all reflections included in the refinement | 0.3422 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.446 |
| Diffraction radiation wavelength | 0.8 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7117444.html
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Users of the data should acknowledge the original authors of the
structural data.