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Information card for entry 7117609
Preview
| Coordinates | 7117609.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C26 H18 |
|---|---|
| Calculated formula | C26 H18 |
| SMILES | c1ccccc1c1ccc2c(c1)cc1ccc(c3ccccc3)cc1c2 |
| Title of publication | Thin film field-effect transistors of 2,6-diphenyl anthracene (DPA) |
| Authors of publication | Liu, Jie; Dong, Huanli; Wang, Zongrui; Ji, Deyang; Cheng, Changli; Geng, Hua; Zhang, Hantang; Zhen, Yonggang; Jiang, Lang; Fu, Hongbing; Bo, Zhishan; Chen, Wei; Shuai, Zhigang; Hu, Wenping |
| Journal of publication | Chemical Communications (Cambridge, United Kingdom) |
| Year of publication | 2015 |
| Journal volume | 51 |
| Journal issue | 59 |
| Pages of publication | 11777 - 11779 |
| a | 17.973 ± 0.008 Å |
| b | 7.352 ± 0.003 Å |
| c | 6.245 ± 0.003 Å |
| α | 90° |
| β | 90.646 ± 0.009° |
| γ | 90° |
| Cell volume | 825.1 ± 0.6 Å3 |
| Cell temperature | 113 ± 2 K |
| Ambient diffraction temperature | 113 ± 2 K |
| Number of distinct elements | 2 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0788 |
| Residual factor for significantly intense reflections | 0.0563 |
| Weighted residual factors for significantly intense reflections | 0.1314 |
| Weighted residual factors for all reflections included in the refinement | 0.1471 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.071 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Duplicate of | 7117464 |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7117609.html
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Users of the data should acknowledge the original authors of the
structural data.