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Information card for entry 7120853
Preview
| Coordinates | 7120853.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C450 H618 Eu4 N48 S44 |
|---|---|
| Calculated formula | C450 H618 Eu4 N48 S44 |
| SMILES | [Eu]123456([n]7c8N=c9n1c(=Nc1[n]3c(=Nc3n2c(N=c7c2c8cc(SCCCCCC)c(SCCCCCC)c2)c2c3cc(SCCCCCC)c(SCCCCCC)c2)c2c1cc(SCCCCCC)c(SCCCCCC)c2)c1c9cc(SCCCCCC)c(SCCCCCC)c1)[n]12[Eu]3789%10([n]%114c4N=c%12[n]53c(=Nc3[n]67c(=Nc1c1cc(SCCCCCC)c(SCCCCCC)cc1c2N=c%11c1cc(SCCCCCC)c(SCCCCCC)cc41)c1c3cc(SCCCCCC)c(SCCCCCC)c1)c1c%12cc(SCCCCCC)c(SCCCCCC)c1)n1c2=Nc3[n]8c(=Nc4n9c(N=c5[n]%10c(N=c1c1c2Cc2c(c6[n]7[Eu]89%10%11%12([n]%13%14c%15N=c%16[n]%178[Eu]8%18%19%20%13(n%13c%21=Nc%22[n]%19c(=Nc%19n%18c(N=c%18[n]8c(N=c%13c8c%21cc(SCCCCCC)c(SCCCCCC)c8)c8cc(SCCCCCC)c(SCCCCCC)cc%188)c8c%19cc(SCCCCCC)c(SCCCCCC)c8)c8cc(SCCCCCC)c(SCCCCCC)cc%228)[n]89c(N=c%17c9c%16cc(SCCCCCC)c(SCCCCCC)c9)c9cc(SCCCCCC)c(SCCCCCC)cc9c8=Nc8c9cc(SCCCCCC)c(SCCCCCC)cc9c([n]%10%208)N=c%14c8cc(SCCCCCC)c(SCCCCCC)cc%158)n8c(=Nc9[n]%11c(=Nc%10n%12c(N=c27)c2c%10cc(SCCCCCC)c(SCCCCCC)c2)c2cc(SCCCCCC)c(SCCCCCC)cc92)c2cc(SCCCCCC)c(SCCCCCC)cc2c8=N6)c1)c1c5cc(SCCCCCC)c(SCCCCCC)c1)c1cc(SCCCCCC)c(SCCCCCC)cc41)c1cc(SCCCCCC)c(SCCCCCC)cc31 |
| Title of publication | Solution-processed single crystal microsheets of a novel dimeric phthalocyanine-involved triple-decker for high-performance ambipolar organic field effect transistors |
| Authors of publication | Jiang, Jianzhuang; Lu, Guang; Chen, Yanli; Kong, Xia; Sun, Junshan; Zhang, Liangliang |
| Journal of publication | Chemical Communications |
| Year of publication | 2017 |
| a | 18.4066 ± 0.0003 Å |
| b | 26.4212 ± 0.0006 Å |
| c | 27.4788 ± 0.0006 Å |
| α | 106.338 ± 0.002° |
| β | 108.689 ± 0.002° |
| γ | 102.171 ± 0.002° |
| Cell volume | 11462.6 ± 0.5 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1408 |
| Residual factor for significantly intense reflections | 0.0781 |
| Weighted residual factors for significantly intense reflections | 0.2055 |
| Weighted residual factors for all reflections included in the refinement | 0.2378 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.967 |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7120853.html
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