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Information card for entry 7121049
Preview
| Coordinates | 7121049.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C22 H28 P2 Pt |
|---|---|
| Calculated formula | C22 H28 P2 Pt |
| SMILES | C(#Cc1ccccc1)[Pt](C#Cc1ccccc1)([P](C)(C)C)[P](C)(C)C |
| Title of publication | Multiply "trapped" <sup>3</sup>[trans-Pt(PR<sub>3</sub>)<sub>2</sub>(C[triple bond, length as m-dash]CC<sub>6</sub>H<sub>4</sub>X)<sub>2</sub>]* conformers in rigid media. |
| Authors of publication | Marineau-Plante, Gabriel; Juvenal, Frank; Langlois, Adam; Fortin, Daniel; Soldera, Armand; Harvey, Pierre D. |
| Journal of publication | Chemical communications (Cambridge, England) |
| Year of publication | 2018 |
| Journal volume | 54 |
| Journal issue | 8 |
| Pages of publication | 976 - 979 |
| a | 23.4379 ± 0.0018 Å |
| b | 5.7868 ± 0.0005 Å |
| c | 17.474 ± 0.0013 Å |
| α | 90° |
| β | 111.709 ± 0.003° |
| γ | 90° |
| Cell volume | 2201.9 ± 0.3 Å3 |
| Cell temperature | 172 ± 2 K |
| Ambient diffraction temperature | 172 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0514 |
| Residual factor for significantly intense reflections | 0.0432 |
| Weighted residual factors for significantly intense reflections | 0.1565 |
| Weighted residual factors for all reflections included in the refinement | 0.1644 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.211 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7121049.html
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