Information card for entry 7126222

Structure parameters

• Formula: C51 H58 Al F36 N5 O4 Si
• Calculated formula: C51 H58 Al F36 N5 O4 Si
• SMILES: [SiH]1(NC(C)(C)C)[N](c2c(cccc2C(C)C)C(C)C)=C(N(C)C)C=C(N1c1c(cccc1C(C)C)C(C)C)N(C)C.[Al](OC(C(F)(F)F)(C(F)(F)F)C(F)(F)F)(OC(C(F)(F)F)(C(F)(F)F)C(F)(F)F)(OC(C(F)(F)F)(C(F)(F)F)C(F)(F)F)OC(C(F)(F)F)(C(F)(F)F)C(F)(F)F
• Title of publication: N-H cleavage vs. Werner complex formation: reactivity of cationic group 14 tetrelenes towards amines.
• Authors of publication: Do, Dinh Cao Huan; Protchenko, Andrey V.; Fuentes, M Ángeles; Hicks, Jamie; Vasko, Petra; Aldridge, Simon
• Journal of publication: Chemical communications (Cambridge, England)
• Year of publication: 2020
• Journal volume: 56
• Journal issue: 34
• Pages of publication: 4684 - 4687
• a: 11.1801 ± 0.0006 Å
• b: 14.7647 ± 0.0009 Å
• c: 20.0683 ± 0.0008 Å
• α: 82.558 ± 0.004°
• β: 87.937 ± 0.004°
• γ: 85.473 ± 0.005°
• Cell volume: 3273.4 ± 0.3 ų
• Cell temperature: 150 ± 2 K
• Ambient diffraction temperature: 150 ± 2 K
• Number of distinct elements: 7
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.1273
• Residual factor for significantly intense reflections: 0.0747
• Weighted residual factors for significantly intense reflections: 0.2003
• Weighted residual factors for all reflections included in the refinement: 0.2381
• Goodness-of-fit parameter for all reflections included in the refinement: 1.021
• Diffraction radiation wavelength: 1.54184 Å
• Diffraction radiation type: CuKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No