Information card for entry 7126333

Structure parameters

• Formula: C88 H78 N4 P4 Pd2 Si2
• Calculated formula: C88 H78 N4 P4 Pd2 Si2
• SMILES: [Pd]1234[Pd]56([P](CN7[Si]35(N(C[P]1(c1ccccc1)c1ccccc1)c1ccccc71)c1ccccc1)(c1ccccc1)c1ccccc1)[P](CN1[Si]46(N(C[P]2(c2ccccc2)c2ccccc2)c2ccccc12)c1ccccc1)(c1ccccc1)c1ccccc1.c1ccccc1.c1ccccc1
• Title of publication: Semi-bridging σ-silyls as Z-type ligands.
• Authors of publication: Frogley, Benjamin J.; Hill, Anthony F.; Sharma, Manab; Sinha, Arup; Ward, Jas S.
• Journal of publication: Chemical communications (Cambridge, England)
• Year of publication: 2020
• Journal volume: 56
• Journal issue: 24
• Pages of publication: 3532 - 3535
• a: 13.545 ± 0.0003 Å
• b: 17.6245 ± 0.0006 Å
• c: 17.7005 ± 0.0004 Å
• α: 99.727 ± 0.002°
• β: 103.685 ± 0.002°
• γ: 109.549 ± 0.003°
• Cell volume: 3724.1 ± 0.2 ų
• Cell temperature: 150 ± 0.1 K
• Ambient diffraction temperature: 150 ± 0.1 K
• Number of distinct elements: 6
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.063
• Residual factor for significantly intense reflections: 0.0558
• Weighted residual factors for significantly intense reflections: 0.1423
• Weighted residual factors for all reflections included in the refinement: 0.1515
• Goodness-of-fit parameter for all reflections included in the refinement: 1.033
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 1.54184 Å
• Diffraction radiation type: CuKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No