Information card for entry 7127391

Structure parameters

• Common name: Cu(NHC)(hmds)
• Chemical name: (1,3-di-tert-butyl-imidazolin-2-ylidene) copper(I) bis(trimethylsilyl)amide
• Formula: C17 H40 Cu N3 Si2
• Calculated formula: C17 H40 Cu N3 Si2
• SMILES: [Cu](N([Si](C)(C)C)[Si](C)(C)C)=C1N(CCN1C(C)(C)C)C(C)(C)C
• Title of publication: A carbene stabilized precursor for the spatial atomic layer deposition of copper thin films.
• Authors of publication: Boysen, Nils; Misimi, Bujamin; Muriqi, Arbresha; Wree, Jan-Lucas; Hasselmann, Tim; Rogalla, Detlef; Haeger, Tobias; Theirich, Detlef; Nolan, Michael; Riedl, Thomas; Devi, Anjana
• Journal of publication: Chemical communications (Cambridge, England)
• Year of publication: 2020
• Journal volume: 56
• Journal issue: 89
• Pages of publication: 13752 - 13755
• a: 8.858 ± 0.0005 Å
• b: 9.6854 ± 0.0006 Å
• c: 14.7645 ± 0.0009 Å
• α: 104.257 ± 0.005°
• β: 103.276 ± 0.005°
• γ: 101.697 ± 0.005°
• Cell volume: 1148.85 ± 0.13 ų
• Cell temperature: 100 ± 0.1 K
• Ambient diffraction temperature: 100 ± 0.1 K
• Number of distinct elements: 5
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.04
• Residual factor for significantly intense reflections: 0.0327
• Weighted residual factors for significantly intense reflections: 0.0805
• Weighted residual factors for all reflections included in the refinement: 0.0856
• Goodness-of-fit parameter for all reflections included in the refinement: 1.036
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 1.54184 Å
• Diffraction radiation type: CuKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No