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Information card for entry 7128508
Preview
| Coordinates | 7128508.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C59 H84 N2 O3 |
|---|---|
| Calculated formula | C56 H78 N2 O2 |
| SMILES | C1=C(C(C)(C)C)C(=O)C(=CC1=c1c(c2ccccc2)c(c2ccccc2)c(c2cc(C(C)(C)C)c([O-])c(c2)C(C)(C)C)n1)C(C)(C)C.[N+](CCC)(CCC)(CCC)CCC |
| Title of publication | Pyrrole-bridged quinones: π-electronic systems that modulate electronic structures by tautomerism and deprotonation. |
| Authors of publication | Sugiura, Shinya; Maeda, Hiromitsu |
| Journal of publication | Chemical communications (Cambridge, England) |
| Year of publication | 2021 |
| Journal volume | 57 |
| Journal issue | 57 |
| Pages of publication | 6983 - 6986 |
| a | 11.902 ± 0.003 Å |
| b | 13.335 ± 0.003 Å |
| c | 18.233 ± 0.004 Å |
| α | 80.776 ± 0.007° |
| β | 82.656 ± 0.009° |
| γ | 70.927 ± 0.008° |
| Cell volume | 2690.7 ± 1.1 Å3 |
| Cell temperature | 90 K |
| Ambient diffraction temperature | 90 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1233 |
| Residual factor for significantly intense reflections | 0.0901 |
| Weighted residual factors for significantly intense reflections | 0.2354 |
| Weighted residual factors for all reflections included in the refinement | 0.2583 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.05 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7128508.html
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