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Information card for entry 7129241
Preview
| Coordinates | 7129241.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C28 H35 Fe Ge N2 P Si2 |
|---|---|
| Calculated formula | C28 H35 Fe Ge N2 P Si2 |
| SMILES | [c]123[Fe]456789%10%11[c]2([cH]4[cH]5[cH]36)[P]([Ge](N1[Si](C)(C)C)N([Si](C)(C)C)[c]17[cH]8[cH]9[cH]%10[cH]%111)(c1ccccc1)c1ccccc1 |
| Title of publication | Planar-chiral 1,1’-diaminoferrocenes |
| Authors of publication | Guthardt, Robin; Blanckenberg, Johannes; Bruhn, Clemens; Siemeling, Ulrich |
| Journal of publication | Chemical Communications |
| Year of publication | 2021 |
| a | 14.815 ± 0.0005 Å |
| b | 11.115 ± 0.0002 Å |
| c | 18.0884 ± 0.0006 Å |
| α | 90° |
| β | 104.095 ± 0.003° |
| γ | 90° |
| Cell volume | 2888.92 ± 0.15 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0331 |
| Residual factor for significantly intense reflections | 0.0309 |
| Weighted residual factors for significantly intense reflections | 0.082 |
| Weighted residual factors for all reflections included in the refinement | 0.0838 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.057 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54186 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7129241.html
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