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Information card for entry 7131149
Preview
| Coordinates | 7131149.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C36 H28 N2 S2 |
|---|---|
| Calculated formula | C36 H28 N2 S2 |
| SMILES | c1c2c(C(C)(C)c3cccc4c3N2c2ccccc2S4)cc2c1C(C)(C)c1cccc3c1N2c1ccccc1S3 |
| Title of publication | A double-helical S,C-bridged tetraphenyl-<i>para</i>-phenylenediamine and its persistent radical cation. |
| Authors of publication | Harada, Kaho; Hasegawa, Chika; Matsumoto, Taisuke; Sugishita, Hiroki; Kitamura, Chitoshi; Higashibayashi, Shuhei; Hasegawa, Masashi; Suzuki, Shuichi; Kato, Shin-Ichiro |
| Journal of publication | Chemical communications (Cambridge, England) |
| Year of publication | 2023 |
| Journal volume | 59 |
| Journal issue | 10 |
| Pages of publication | 1301 - 1304 |
| a | 25.8351 ± 0.0009 Å |
| b | 12.3566 ± 0.0005 Å |
| c | 8.2933 ± 0.0003 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 2647.5 ± 0.17 Å3 |
| Cell temperature | 100 K |
| Ambient diffraction temperature | 100 K |
| Number of distinct elements | 4 |
| Space group number | 33 |
| Hermann-Mauguin space group symbol | P n a 21 |
| Hall space group symbol | P 2c -2n |
| Residual factor for all reflections | 0.0371 |
| Residual factor for significantly intense reflections | 0.0322 |
| Weighted residual factors for significantly intense reflections | 0.0749 |
| Weighted residual factors for all reflections included in the refinement | 0.0768 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.028 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7131149.html
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Users of the data should acknowledge the original authors of the
structural data.