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Information card for entry 7131528
Preview
| Coordinates | 7131528.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C30 H52 Al I N2 Si2 |
|---|---|
| Calculated formula | C30 H52 Al I N2 Si2 |
| SMILES | [Al](N([Si](C)(C)C)c1c(cccc1C(C)C)C(C)C)(N([Si](C)(C)C)c1c(C(C)C)cccc1C(C)C)I |
| Title of publication | An acyclic aluminyl anion. |
| Authors of publication | Jackson, Ross A.; Matthews, Aidan J. R.; Vasko, Petra; Mahon, Mary F.; Hicks, Jamie; Liptrot, David J. |
| Journal of publication | Chemical communications (Cambridge, England) |
| Year of publication | 2023 |
| Journal volume | 59 |
| Journal issue | 35 |
| Pages of publication | 5277 - 5280 |
| a | 10.1072 ± 0.0006 Å |
| b | 10.2573 ± 0.0006 Å |
| c | 17.9608 ± 0.0008 Å |
| α | 89.292 ± 0.004° |
| β | 83.539 ± 0.004° |
| γ | 66.374 ± 0.006° |
| Cell volume | 1694.04 ± 0.18 Å3 |
| Cell temperature | 149.9 ± 0.7 K |
| Ambient diffraction temperature | 149.9 ± 0.7 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0678 |
| Residual factor for significantly intense reflections | 0.0479 |
| Weighted residual factors for significantly intense reflections | 0.1162 |
| Weighted residual factors for all reflections included in the refinement | 0.128 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.035 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7131528.html
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