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Information card for entry 7131586
Preview
| Coordinates | 7131586.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C20 H34 Cu2 N2 O10 |
|---|---|
| Calculated formula | C20 H34 Cu2 N2 O10 |
| Title of publication | Copper(II) defect-cubane water oxidation electrocatalysts: from molecular tetramers to oxidic nanostructures. |
| Authors of publication | Adiyeri Saseendran, Devi Prasad; Fischer, Jörg W A; Müller, Lea; Abbott, Daniel F.; Mougel, Victor; Jeschke, Gunnar; Triana, Carlos A.; Patzke, Greta R. |
| Journal of publication | Chemical communications (Cambridge, England) |
| Year of publication | 2023 |
| Journal volume | 59 |
| Journal issue | 39 |
| Pages of publication | 5866 - 5869 |
| a | 8.0233 ± 0.0001 Å |
| b | 8.8028 ± 0.0002 Å |
| c | 9.6509 ± 0.0001 Å |
| α | 71.076 ± 0.001° |
| β | 86.281 ± 0.001° |
| γ | 77.279 ± 0.001° |
| Cell volume | 628.935 ± 0.018 Å3 |
| Cell temperature | 160 ± 0.1 K |
| Ambient diffraction temperature | 160 ± 0.1 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.031 |
| Residual factor for significantly intense reflections | 0.0247 |
| Weighted residual factors for significantly intense reflections | 0.0642 |
| Weighted residual factors for all reflections included in the refinement | 0.0662 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.062 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7131586.html
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Users of the data should acknowledge the original authors of the
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