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Information card for entry 7131905
Preview
| Coordinates | 7131905.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C49 H63 N2 P Si |
|---|---|
| Calculated formula | C49 H63 N2 P Si |
| SMILES | P1([Si@@]2(N(C(=C(c3ccccc3)/C2=C2/[C@@H]([C@@H]3C41C[C@H]1CC3C[C@@H](C4)C1)C=CC=C2)c1ccccc1)C(C)(C)C)NC(C)(C)C)C12CC3CC(CC(C3)C1)C2 |
| Title of publication | SiP-heterocycles derived from a bulky phosphanylsilylene |
| Authors of publication | Li, Yan; Wang, Chenfeng; Su, Ming-Der; Fang, Zijie; Zhou, Jiahao; Zhang, Haoqi; Li, Xiaodi; Zuo, Darui; Zhang, Zheng-Feng |
| Journal of publication | Chemical Communications |
| Year of publication | 2023 |
| a | 16.6726 ± 0.0008 Å |
| b | 13.2923 ± 0.0006 Å |
| c | 18.7216 ± 0.0009 Å |
| α | 90° |
| β | 90.063 ± 0.002° |
| γ | 90° |
| Cell volume | 4149 ± 0.3 Å3 |
| Cell temperature | 170 K |
| Ambient diffraction temperature | 170 K |
| Number of distinct elements | 5 |
| Space group number | 4 |
| Hermann-Mauguin space group symbol | P 1 21 1 |
| Hall space group symbol | P 2yb |
| Residual factor for all reflections | 0.1024 |
| Residual factor for significantly intense reflections | 0.0587 |
| Weighted residual factors for significantly intense reflections | 0.1315 |
| Weighted residual factors for all reflections included in the refinement | 0.1526 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.071 |
| Diffraction radiation wavelength | 1.34139 Å |
| Diffraction radiation type | GaKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7131905.html
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