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Information card for entry 7133737
Preview
| Coordinates | 7133737.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C15 H8 S |
|---|---|
| Calculated formula | C15 H8 S |
| Title of publication | Thiophene-fused fulminenes (FuDTs): promising platforms for high-mobility organic semiconductors with a zigzag shape. |
| Authors of publication | Kumagai, Shohei; Ishida, Takumi; Kakiuchi, Shin; Yamagishi, Masakazu; Sato, Hiroyasu; Ishii, Hiroyuki; Nishihara, Yasushi; Okamoto, Toshihiro |
| Journal of publication | Chemical communications (Cambridge, England) |
| Year of publication | 2024 |
| Journal volume | 60 |
| Journal issue | 79 |
| Pages of publication | 11152 - 11155 |
| a | 19.1356 ± 0.0011 Å |
| b | 6.0329 ± 0.0003 Å |
| c | 8.5434 ± 0.0006 Å |
| α | 90° |
| β | 95.954 ± 0.007° |
| γ | 90° |
| Cell volume | 980.96 ± 0.1 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 3 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.1472 |
| Residual factor for significantly intense reflections | 0.1277 |
| Weighted residual factors for significantly intense reflections | 0.372 |
| Weighted residual factors for all reflections included in the refinement | 0.3999 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.661 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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