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Information card for entry 7134160
Preview
| Coordinates | 7134160.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | DH-K-GIS |
|---|---|
| Formula | Al5.8 K5.74 O32 Si10.2 |
| Calculated formula | Al5.8 K5.744 O32 Si10.2 |
| Title of publication | Revealing the CO<sub>2</sub> adsorption blocking mechanism in flexible low-silica small-pore zeolites <i>via</i> three-dimensional electron diffraction. |
| Authors of publication | Guo, Jian; Nie, Chenyang; Li, Shitai; Yan, Nana; Guo, Peng; Liu, Zhongmin |
| Journal of publication | Chemical communications (Cambridge, England) |
| Year of publication | 2025 |
| Journal volume | 61 |
| Journal issue | 12 |
| Pages of publication | 2568 - 2571 |
| a | 9.724 ± 0.0014 Å |
| b | 9.724 ± 0.0014 Å |
| c | 9.432 ± 0.0019 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 891.9 ± 0.3 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 88 |
| Hermann-Mauguin space group symbol | I 41/a :2 |
| Hall space group symbol | -I 4ad |
| Residual factor for all reflections | 0.1745 |
| Residual factor for significantly intense reflections | 0.1222 |
| Weighted residual factors for significantly intense reflections | 0.3285 |
| Weighted residual factors for all reflections included in the refinement | 0.3714 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.183 |
| Diffraction radiation wavelength | 0.0251 Å |
| Diffraction radiation type | electron |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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