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Information card for entry 7134295
Preview
| Coordinates | 7134295.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C44 H55 Ge2 N7 |
|---|---|
| Calculated formula | C44 H55 Ge2 N7 |
| Title of publication | Synthesis and characterization of triazole-functionalized mixed-valent Si(i)–Si(iii) and bis(germylene) compounds |
| Authors of publication | Pandey, Madhusudan K.; Hendi, Zohreh; Wang, Xiaobai; Muhammed, Shahila; Kumar, Arun; Singh, Mukesh K.; Herbst-Irmer, Regine; Stalke, Dietmar; Parameswaran, Pattiyil; Roesky, Herbert W. |
| Journal of publication | Chemical Communications |
| Year of publication | 2025 |
| Journal volume | 61 |
| Journal issue | 30 |
| Pages of publication | 5581 - 5584 |
| a | 10.199 ± 0.002 Å |
| b | 13.117 ± 0.002 Å |
| c | 17.906 ± 0.003 Å |
| α | 106.21 ± 0.02° |
| β | 90.75 ± 0.02° |
| γ | 110.7 ± 0.02° |
| Cell volume | 2135 ± 0.8 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0588 |
| Residual factor for significantly intense reflections | 0.0374 |
| Weighted residual factors for significantly intense reflections | 0.0756 |
| Weighted residual factors for all reflections included in the refinement | 0.0835 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.055 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7134295.html
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Users of the data should acknowledge the original authors of the
structural data.