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Information card for entry 7134634
Preview
| Coordinates | 7134634.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C72 H98 S2 U |
|---|---|
| Calculated formula | C72 H98 S2 U |
| Title of publication | Four-electron oxidation and one-electron reduction of the bis(terphenylthiolate) U(II) complex, U(SAr<sup>iPr6</sup>)<sub>2</sub> [Ar<sup>iPr6</sup> = C<sub>6</sub>H<sub>3</sub>-2,6-(C<sub>6</sub>H<sub>2</sub>-2,4,6-<sup>i</sup>Pr<sub>3</sub>)<sub>2</sub>]. |
| Authors of publication | Queen, Joshua D.; Ma, Eric; Rajabi, Ahmadreza; Ziller, Joseph W.; Furche, Filipp; Evans, William J. |
| Journal of publication | Chemical communications (Cambridge, England) |
| Year of publication | 2025 |
| Journal volume | 61 |
| Journal issue | 56 |
| Pages of publication | 10319 - 10322 |
| a | 9.864 ± 0.009 Å |
| b | 17.52 ± 0.016 Å |
| c | 20.169 ± 0.018 Å |
| α | 87.762 ± 0.011° |
| β | 84.587 ± 0.01° |
| γ | 85.962 ± 0.01° |
| Cell volume | 3460 ± 5 Å3 |
| Cell temperature | 93 ± 2 K |
| Ambient diffraction temperature | 93 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1312 |
| Residual factor for significantly intense reflections | 0.1066 |
| Weighted residual factors for significantly intense reflections | 0.2594 |
| Weighted residual factors for all reflections included in the refinement | 0.2753 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.095 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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