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Information card for entry 7153076
Preview
| Coordinates | 7153076.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C20 H17 N3 S2 |
|---|---|
| Calculated formula | C20 H17 N3 S2 |
| SMILES | S1C(C=C2S\C(C=C12)=C/c1ccc(cc1)N(CC)CC)=C(C#N)C#N |
| Title of publication | Push-pull systems bearing a quinoid/aromatic thieno[3,2-b]thiophene moiety: synthesis, ground state polarization and second-order nonlinear properties. |
| Authors of publication | Marco, A Belén; Andreu, Raquel; Franco, Santiago; Garín, Javier; Orduna, Jesús; Villacampa, Belén; Diosdado, Beatriz E.; López Navarrete, Juan T; Casado, Juan |
| Journal of publication | Organic & biomolecular chemistry |
| Year of publication | 2013 |
| Journal volume | 11 |
| Journal issue | 37 |
| Pages of publication | 6338 - 6349 |
| a | 8.3982 ± 0.0004 Å |
| b | 25.3341 ± 0.0019 Å |
| c | 17.1667 ± 0.0011 Å |
| α | 90° |
| β | 97.599 ± 0.005° |
| γ | 90° |
| Cell volume | 3620.3 ± 0.4 Å3 |
| Cell temperature | 150 ± 1 K |
| Ambient diffraction temperature | 150 ± 1 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.1243 |
| Residual factor for significantly intense reflections | 0.0654 |
| Weighted residual factors for significantly intense reflections | 0.1214 |
| Weighted residual factors for all reflections included in the refinement | 0.1487 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.014 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7153076.html
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Users of the data should acknowledge the original authors of the
structural data.