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Information card for entry 7159476
Preview
| Coordinates | 7159476.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C46 H42 N O7 P |
|---|---|
| Calculated formula | C46 H42 N O7 P |
| SMILES | P1(=O)(OC([C@H]2OC(O[C@@H]2C(O1)(c1ccccc1)c1ccccc1)(C)C)(c1ccccc1)c1ccccc1)[C@H](NC(=O)OCc1ccccc1)c1ccccc1 |
| Title of publication | α-Amido sulphones as useful intermediates in the preparation of <i>C</i>-chiral α-aminophosphonates and α-aminophosphonic acids. |
| Authors of publication | Gbubele, Joseph D.; Misiaszek, Tomasz; Siczek, Miłosz; Olszewski, Tomasz K. |
| Journal of publication | Organic & biomolecular chemistry |
| Year of publication | 2023 |
| Journal volume | 21 |
| Journal issue | 30 |
| Pages of publication | 6180 - 6191 |
| a | 10.768 ± 0.003 Å |
| b | 11.588 ± 0.003 Å |
| c | 31.149 ± 0.007 Å |
| α | 90° |
| β | 98.37 ± 0.02° |
| γ | 90° |
| Cell volume | 3845.4 ± 1.7 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 3 |
| Hermann-Mauguin space group symbol | P 1 2 1 |
| Hall space group symbol | P 2y |
| Residual factor for all reflections | 0.0478 |
| Residual factor for significantly intense reflections | 0.0463 |
| Weighted residual factors for significantly intense reflections | 0.1197 |
| Weighted residual factors for all reflections included in the refinement | 0.1206 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.112 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7159476.html
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Users of the data should acknowledge the original authors of the
structural data.