Information card for entry 7201458
| Formula |
C9 H21 Cu2 N9 O8 |
| Calculated formula |
C9 H21 Cu2 N9 O8 |
| SMILES |
C12(CC(=O)O[Cu]3([NH]=C(N)N)[O]1[Cu]([OH]3)([NH]=C(N)N)OC(=O)C2)C(=O)[O-].C(=[NH2+])(N)N |
| Title of publication |
Polymerisation of a Cu(II) dimer into 1D chains using high pressure |
| Authors of publication |
Moggach, Stephen A.; Galloway, Kyle W.; Lennie, Alistair R.; Parois, Pascal; Rowantree, Niall; Brechin, Euan K.; Warren, John E.; Murrie, Mark; Parsons, Simon |
| Journal of publication |
CrystEngComm |
| Year of publication |
2009 |
| Journal volume |
11 |
| Journal issue |
12 |
| Pages of publication |
2601 |
| a |
15.6012 ± 0.0009 Å |
| b |
12.5198 ± 0.0003 Å |
| c |
8.8557 ± 0.0002 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
1729.73 ± 0.11 Å3 |
| Cell temperature |
293 K |
| Ambient diffraction temperature |
293 K |
| Number of distinct elements |
5 |
| Space group number |
62 |
| Hermann-Mauguin space group symbol |
P n m a |
| Hall space group symbol |
-P 2ac 2n |
| Residual factor for all reflections |
0.0454 |
| Residual factor for significantly intense reflections |
0.0305 |
| Weighted residual factors for all reflections |
0.0446 |
| Weighted residual factors for significantly intense reflections |
0.0436 |
| Weighted residual factors for all reflections included in the refinement |
0.0446 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.4785 |
| Diffraction radiation wavelength |
0.4767 Å |
| Diffraction radiation type |
Synchrotron |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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