Information card for entry 7202726
| Common name |
5,5'-bis(4-ethylphenyl)-2,2'-bithiophene |
| Chemical name |
5,5'-bis(4-ethylphenyl)-2,2'-bithiophene |
| Formula |
C24 H22 S2 |
| Calculated formula |
C24 H22 S2 |
| SMILES |
c1(ccc(c2ccc(cc2)CC)s1)c1sc(c2ccc(cc2)CC)cc1 |
| Title of publication |
Molecular ordering in bis(phenylenyl)bithiophenes |
| Authors of publication |
Stokes, Melissa A.; Kortan, Refik; Amy, Sandrine Rivillon; Katz, Howard E.; Chabal, Yves J.; Kloc, Christian; Siegrist, Theo |
| Journal of publication |
Journal of Materials Chemistry |
| Year of publication |
2007 |
| Journal volume |
17 |
| Journal issue |
32 |
| Pages of publication |
3427 |
| a |
9.242 ± 0.004 Å |
| b |
5.718 ± 0.0011 Å |
| c |
18.205 ± 0.006 Å |
| α |
90° |
| β |
100.06 ± 0.03° |
| γ |
90° |
| Cell volume |
947.3 ± 0.6 Å3 |
| Cell temperature |
300 K |
| Ambient diffraction temperature |
300 K |
| Number of distinct elements |
3 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/a 1 |
| Hall space group symbol |
-P 2yab |
| Residual factor for all reflections |
0.1888 |
| Residual factor for significantly intense reflections |
0.0418 |
| Weighted residual factors for all reflections |
0.1943 |
| Weighted residual factors for significantly intense reflections |
0.0826 |
| Weighted residual factors for all reflections included in the refinement |
0.1943 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.9467 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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