Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7202940
Preview
| Coordinates | 7202940.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C14 H21 N3 O8 P2 |
|---|---|
| Calculated formula | C14 H19 N3 O8 P2 |
| SMILES | C(C)([NH3+])(P(=O)(O)[O-])P(=O)(O)[O-].c1ccc2c(c3c(ccc[nH+]3)cc2)n1.O.O |
| Title of publication | Self-assembly of organic acid‒base compounds from 2-D layered network to 3-D supramolecular framework: synthesis, structure and photoluminescence |
| Authors of publication | Wu, Simin; Chen, Shuoping; Li, Ming; Xiang, Jiangfeng; Xiao, Yong; Yuan, Liangjie |
| Journal of publication | CrystEngComm |
| Year of publication | 2007 |
| Journal volume | 9 |
| Journal issue | 10 |
| Pages of publication | 907 |
| a | 7.0561 ± 0.0006 Å |
| b | 9.9086 ± 0.0008 Å |
| c | 13.0837 ± 0.001 Å |
| α | 83.777 ± 0.001° |
| β | 79.444 ± 0.001° |
| γ | 85.213 ± 0.001° |
| Cell volume | 892.09 ± 0.12 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0539 |
| Residual factor for significantly intense reflections | 0.0482 |
| Weighted residual factors for significantly intense reflections | 0.1295 |
| Weighted residual factors for all reflections included in the refinement | 0.1356 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.024 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7202940.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.