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Information card for entry 7203209
Preview
| Coordinates | 7203209.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C12 H22 N10 O4 Pt S4 |
|---|---|
| Calculated formula | C12 H22 N10 O4 Pt S4 |
| SMILES | C(N)(N)=[S][Pt]([S]=C(N)N)([S]=C(N)N)[S]=C(N)N.C1(=O)C(=O)C([O-])=C1[O-].CC#N.CC#N |
| Title of publication | Tetrakis(thiourea)platinum(ii) oxocarbodianions salts as molecular building blocks for the synthesis of hydrogen bonded networks in the solid state |
| Authors of publication | Gale, Philip A.; Light, Mark E.; Quesada, Roberto |
| Journal of publication | CrystEngComm |
| Year of publication | 2006 |
| Journal volume | 8 |
| Journal issue | 2 |
| Pages of publication | 178 |
| a | 8.8659 ± 0.0009 Å |
| b | 12.7545 ± 0.0008 Å |
| c | 11.0019 ± 0.0015 Å |
| α | 90° |
| β | 110.91 ± 0.007° |
| γ | 90° |
| Cell volume | 1162.2 ± 0.2 Å3 |
| Cell temperature | 120 ± 2 K |
| Ambient diffraction temperature | 120 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0566 |
| Residual factor for significantly intense reflections | 0.0301 |
| Weighted residual factors for significantly intense reflections | 0.0617 |
| Weighted residual factors for all reflections included in the refinement | 0.0708 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.977 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7203209.html
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Users of the data should acknowledge the original authors of the
structural data.