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Information card for entry 7204126
Preview
| Coordinates | 7204126.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | 2,4,7-trinitro-9-dicyanomethylenefluorene 4-iodotetrathiafulvalene |
|---|---|
| Formula | C22 H8 I N5 O6 S4 |
| Calculated formula | C22 H7 I N5 O6 S4 |
| Title of publication | Synthesis and crystal engineering of new halogenated tetrathiafulvalene (TTF) derivatives and their charge transfer complexes and radical ion salts |
| Authors of publication | Batsanov, Andrei S.; Bryce, Martin R.; Chesney, Antony; Howard, Judith A. K.; John, Derek E.; Moore, Adrian J.; Wood, Clare L.; Gershtenman, Hagit; Becker, James Y.; Khodorkovsky, Vladimir Y.; Ellern, Arkady; Bernstein, Joel; Perepichka, Igor F.; Rotello, Vincent; Gray, Mark; Cuello, Alejandro O. |
| Journal of publication | Journal of Materials Chemistry |
| Year of publication | 2001 |
| Journal volume | 11 |
| Journal issue | 9 |
| Pages of publication | 2181 |
| a | 11.209 ± 0.004 Å |
| b | 7.16 ± 0.003 Å |
| c | 29.917 ± 0.003 Å |
| α | 90° |
| β | 94.03 ± 0.02° |
| γ | 90° |
| Cell volume | 2395.1 ± 1.3 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.1581 |
| Residual factor for significantly intense reflections | 0.1299 |
| Weighted residual factors for significantly intense reflections | 0.3127 |
| Weighted residual factors for all reflections included in the refinement | 0.3381 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.285 |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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