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Information card for entry 7204164
Preview
| Coordinates | 7204164.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | DSDTeF |
|---|---|
| Formula | C6 H4 Se2 Te2 |
| Calculated formula | C6 H4 Se2.33333 Te1.78667 |
| Title of publication | Novel tellurium containing fulvalene-type electron donors, triselenatellurafulvalene (TSTeF) and diselenaditellurafulvalene (DSDTeF); synthesis, conductivities and crystal structures of their TCNQ complexes |
| Authors of publication | Morikami, Atsushi; Takimiya, Kazuo; Aso, Yoshio; Otsubo, Tetsuo |
| Journal of publication | Journal of Materials Chemistry |
| Year of publication | 2001 |
| Journal volume | 11 |
| Journal issue | 10 |
| Pages of publication | 2431 |
| a | 9.088 ± 0.003 Å |
| b | 10.845 ± 0.003 Å |
| c | 8.875 ± 0.003 Å |
| α | 106.46 ± 0.03° |
| β | 109.79 ± 0.03° |
| γ | 104.14 ± 0.03° |
| Cell volume | 731.1 ± 0.5 Å3 |
| Cell temperature | 296.2 K |
| Ambient diffraction temperature | 296.2 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0381 |
| Residual factor for significantly intense reflections | 0.0378 |
| Weighted residual factors for significantly intense reflections | 0.0436 |
| Weighted residual factors for all reflections included in the refinement | 0.0437 |
| Goodness-of-fit parameter for all reflections included in the refinement | 3.157 |
| Diffraction radiation wavelength | 0.7107 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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