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Information card for entry 7204392
Preview
| Coordinates | 7204392.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | Ph4Sn |
|---|---|
| Chemical name | Ph4Sn |
| Formula | C24 H20 Sn |
| Calculated formula | C24 H20 Sn |
| SMILES | c1(ccccc1)[Sn](c1ccccc1)(c1ccccc1)c1ccccc1 |
| Title of publication | Calculations of optical properties of the tetraphenyl-X family of isomorphous crystals (X = C, Si, Ge, Sn, Pb) |
| Authors of publication | Claborn, Kacey; Kahr, Bart; Kaminsky, Werner |
| Journal of publication | CrystEngComm |
| Year of publication | 2002 |
| Journal volume | 4 |
| Journal issue | 46 |
| Pages of publication | 252 - 256 |
| a | 12.068 ± 0.0004 Å |
| b | 12.068 ± 0.0004 Å |
| c | 6.557 ± 0.0003 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 954.94 ± 0.06 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 3 |
| Space group number | 114 |
| Hermann-Mauguin space group symbol | P -4 21 c |
| Hall space group symbol | P -4 2n |
| Residual factor for all reflections | 0.0338 |
| Residual factor for significantly intense reflections | 0.0238 |
| Weighted residual factors for significantly intense reflections | 0.0594 |
| Weighted residual factors for all reflections included in the refinement | 0.0671 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.132 |
| Diffraction radiation wavelength | 0.7107 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7204392.html
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