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Information card for entry 7204873
Preview
| Coordinates | 7204873.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | bis(4-nitrophenyl)diphenylmethane-THF |
|---|---|
| Chemical name | bis(4-nitrophenyl)diphenylmethane-THF |
| Formula | C78 H54 N6 O16 |
| Calculated formula | C78 H54 N6 O16 |
| Title of publication | Host?guest and network structures of some tetraphenylmethane derivativesElectronic supplementary information (ESI) available: ORTEP diagrams of the compounds in this study; structure solution and refinement details for (TCTPM)�(MeCN)0.5. See http://www.rsc.org/suppdata/ce/b4/b403858b/ |
| Authors of publication | Basavoju, Srinivas; Aitipamula, Srinivasulu; Desiraju, Gautam R. |
| Journal of publication | CrystEngComm |
| Year of publication | 2004 |
| Journal volume | 6 |
| Journal issue | 25 |
| Pages of publication | 120 |
| a | 20.916 ± 0.003 Å |
| b | 20.916 ± 0.003 Å |
| c | 25.122 ± 0.005 Å |
| α | 90° |
| β | 90° |
| γ | 120° |
| Cell volume | 9518 ± 3 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 148 |
| Hermann-Mauguin space group symbol | R -3 :H |
| Hall space group symbol | -R 3 |
| Residual factor for all reflections | 0.0984 |
| Residual factor for significantly intense reflections | 0.0574 |
| Weighted residual factors for significantly intense reflections | 0.1294 |
| Weighted residual factors for all reflections included in the refinement | 0.1555 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.018 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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