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Information card for entry 7205030
Preview
| Coordinates | 7205030.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | Ag5 I2 S3 Sb |
|---|---|
| Calculated formula | Ag13.988 I3 S3 Sb |
| Title of publication | Preparation, structural, Raman and impedance spectroscopic characterisation of the silver ion conductor (AgI)2Ag3SbS3 |
| Authors of publication | Nilges, Tom; Reiser, Sara; Hong, Jung Hoon; Gaudin, Etienne; Pfitzner, Arno |
| Journal of publication | Physical Chemistry Chemical Physics |
| Year of publication | 2002 |
| Journal volume | 4 |
| Journal issue | 23 |
| Pages of publication | 5888 - 5894 |
| a | 11.071 ± 0.001 Å |
| b | 13.699 ± 0.001 Å |
| c | 7.7633 ± 0.0006 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1177.39 ± 0.16 Å3 |
| Cell temperature | 573 K |
| Number of distinct elements | 4 |
| Space group number | 58 |
| Hermann-Mauguin space group symbol | P n n m |
| Hall space group symbol | -P 2 2n |
| Residual factor for all reflections | 0.0686 |
| Residual factor for significantly intense reflections | 0.033 |
| Weighted residual factors for all reflections | 0.0706 |
| Weighted residual factors for significantly intense reflections | 0.0648 |
| Goodness-of-fit parameter for all reflections | 1.52 |
| Goodness-of-fit parameter for significantly intense reflections | 1.21 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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