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Information card for entry 7205131
Preview
| Coordinates | 7205131.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C52.4 H40 F0.6 Fe N0.4 O13 S32 |
|---|---|
| Calculated formula | C52.4 H40 F0.6 Fe N0.4 O13 S32 |
| Title of publication | Effect of electrocrystallization medium on quality, structural features, and conducting properties of single crystals of the (BEDT-TTF)4AI[FeIII(C2O4)3]·G family |
| Authors of publication | Prokhorova, T. G.; Buravov, L. I.; Yagubskii, E. B.; Zorina, L. V.; Khasanov, S. S.; Simonov, S. V.; Shibaeva, R. P.; Korobenko, A. V.; Zverev, V. N. |
| Journal of publication | CrystEngComm |
| Year of publication | 2011 |
| Journal volume | 13 |
| Journal issue | 2 |
| Pages of publication | 537 |
| a | 10.2794 ± 0.0006 Å |
| b | 20.019 ± 0.001 Å |
| c | 35.255 ± 0.002 Å |
| α | 90° |
| β | 92.496 ± 0.005° |
| γ | 90° |
| Cell volume | 7248 ± 0.7 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0598 |
| Residual factor for significantly intense reflections | 0.0431 |
| Weighted residual factors for significantly intense reflections | 0.1077 |
| Weighted residual factors for all reflections included in the refinement | 0.1139 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.008 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7205131.html
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