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Information card for entry 7205145
Preview
| Coordinates | 7205145.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C44 H66 O10 |
|---|---|
| Calculated formula | C44 H57 O10 |
| SMILES | Oc1c2cc(cc1C[C@]13O[C@]([C@@H](O)C(O)([C@H]1O)C(C)(C)C)(C3)Cc1cc(cc(c1O)C[C@]1(O)CC(O)(C[C@@](O)(C1O)C2)C(C)(C)C)C(C)(C)C)C(C)(C)C |
| Title of publication | Solid-state assembly of calixcyclitol derivatives |
| Authors of publication | Gaeta, Carmine; Troisi, Francesco; Spagna, Riccardo; Camalli, Mercedes; Campi, Gaetano; Neri, Placido |
| Journal of publication | CrystEngComm |
| Year of publication | 2011 |
| Journal volume | 13 |
| Journal issue | 2 |
| Pages of publication | 467 |
| a | 16.868 ± 0.003 Å |
| b | 12.789 ± 0.003 Å |
| c | 20.295 ± 0.004 Å |
| α | 90° |
| β | 102.33 ± 0.02° |
| γ | 90° |
| Cell volume | 4277.1 ± 1.5 Å3 |
| Cell temperature | 293 K |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 3 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.164 |
| Residual factor for significantly intense reflections | 0.078 |
| Weighted residual factors for all reflections | 0.168 |
| Weighted residual factors for significantly intense reflections | 0.103 |
| Weighted residual factors for all reflections included in the refinement | 0.103 |
| Goodness-of-fit parameter for all reflections | 0.86 |
| Goodness-of-fit parameter for significantly intense reflections | 0.953 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.953 |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7205145.html
All data in the COD and the database itself are dedicated to the
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.
Users of the data should acknowledge the original authors of the
structural data.