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Information card for entry 7205442
Preview
| Coordinates | 7205442.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C26 H24 F3 N4 O5 S |
|---|---|
| Calculated formula | C26 H24 F3 N4 O5 S |
| SMILES | s1c(nc2c1cccc2Oc1ncnc(c1)c1ccc(cc1)C(F)(F)F)NC(=O)C.OC(=O)C(O)CC=CC |
| Title of publication | Preparation, solid state characterization, and single crystal structure analysis of N-(4-(6-(4-(trifluoromethyl)phenyl)pyrimidin-4-yloxy)benzo[d]thiazol-2-yl)acetamide crystal forms |
| Authors of publication | Peterson, Matthew L.; Stanton, Mary K.; Kelly, Ron C.; Staples, Richard; Cheng, Alan |
| Journal of publication | CrystEngComm |
| Year of publication | 2011 |
| Journal volume | 13 |
| Journal issue | 4 |
| Pages of publication | 1170 |
| a | 4.7288 ± 0.0011 Å |
| b | 9.1387 ± 0.0019 Å |
| c | 30.731 ± 0.006 Å |
| α | 93.847 ± 0.014° |
| β | 94.068 ± 0.015° |
| γ | 98.881 ± 0.014° |
| Cell volume | 1304.7 ± 0.5 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.19 |
| Residual factor for significantly intense reflections | 0.1015 |
| Weighted residual factors for significantly intense reflections | 0.2674 |
| Weighted residual factors for all reflections included in the refinement | 0.334 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.016 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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