Information card for entry 7205957

Structure parameters

• Formula: C24 H28 Ag2 N16 O21 W6
• Calculated formula: C24 H24 Ag2 N16 O21 W6
• SMILES: O=[W]1234[O]5678[W]9%10%11(O[W]%126(O[W]8(O9)(O4)(O[W]5(O[W]7(O2)(O%11)(O%12)=O)(O1)(O%10)=[O][Ag]12([n]4c([nH]cc4)c4[n]1cc[nH]4)[n]1c(c4[n]2cc[nH]4)[nH]cc1)=O)(O3)=[O][Ag]12([n]3c([nH]cc3)c3[n]1cc[nH]3)[n]1c(c3[n]2cc[nH]3)[nH]cc1)=O.O.O
• Title of publication: The factors affecting on the assembly of Ag‒H2biim system: size, charge or shape of polyanions?
• Authors of publication: Zhang, Peng-peng; Peng, Jun; Pang, Hai-jun; Sha, Jing-quan; Zhu, Min; Wang, Dan-dan; Liu, Ming-guan
• Journal of publication: CrystEngComm
• Year of publication: 2011
• Journal volume: 13
• Journal issue: 11
• Pages of publication: 3832
• a: 10.414 ± 0.003 Å
• b: 10.461 ± 0.003 Å
• c: 10.556 ± 0.003 Å
• α: 72.438 ± 0.004°
• β: 74.048 ± 0.004°
• γ: 78.329 ± 0.003°
• Cell volume: 1045.2 ± 0.5 ų
• Cell temperature: 293 ± 2 K
• Ambient diffraction temperature: 293 ± 2 K
• Number of distinct elements: 6
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0754
• Residual factor for significantly intense reflections: 0.0623
• Weighted residual factors for significantly intense reflections: 0.1838
• Weighted residual factors for all reflections included in the refinement: 0.2004
• Goodness-of-fit parameter for all reflections included in the refinement: 1.073
• Diffraction radiation wavelength: 0.71069 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No