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Information card for entry 7207687
Preview
| Coordinates | 7207687.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C15 H28 N4 O5 Si |
|---|---|
| Calculated formula | C15 H28 N4 O5 Si |
| SMILES | O=c1nc([nH]c(C)c1)NC(=O)NCCC[Si](OCC)(OCC)OCC |
| Title of publication | Investigation on the vibrational and structural properties of a self-structured bridged silsesquioxane. |
| Authors of publication | Creff, Gaëlle; Arrachart, Guilhem; Hermet, Patrick; Wadepohl, Hubert; Almairac, Robert; Maurin, David; Sauvajol, Jean-Louis; Carcel, Carole; Moreau, Joël J E; Dieudonné, Philippe; Man, Michel Wong Chi; Bantignies, Jean-Louis |
| Journal of publication | Physical chemistry chemical physics : PCCP |
| Year of publication | 2012 |
| Journal volume | 14 |
| Journal issue | 16 |
| Pages of publication | 5672 - 5679 |
| a | 35.463 ± 0.003 Å |
| b | 35.463 ± 0.003 Å |
| c | 7.8005 ± 0.0009 Å |
| α | 90° |
| β | 90° |
| γ | 120° |
| Cell volume | 8495.8 ± 1.4 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 148 |
| Hermann-Mauguin space group symbol | R -3 :H |
| Hall space group symbol | -R 3 |
| Residual factor for all reflections | 0.3174 |
| Residual factor for significantly intense reflections | 0.2631 |
| Weighted residual factors for significantly intense reflections | 0.6365 |
| Weighted residual factors for all reflections included in the refinement | 0.6768 |
| Goodness-of-fit parameter for all reflections included in the refinement | 2.928 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
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