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Information card for entry 7211759
Preview
| Coordinates | 7211759.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C44 H48 Cu N2 O2 P3 S2 |
|---|---|
| Calculated formula | C44 H48 Cu N2 O2 P3 S2 |
| SMILES | [Cu]1([P](c2ccccc2)(c2ccccc2)c2ccccc2)([P](c2ccccc2)(c2ccccc2)c2ccccc2)[S]=P(N=C(S1)NC)(OC(C)C)OC(C)C |
| Title of publication | Copper(I) complexes with N-thiophosphorylated thioureas and phosphines with versatile structures and luminescence |
| Authors of publication | Babashkina, Maria G.; Safin, Damir A.; Bolte, Michael; Klein, Axel |
| Journal of publication | CrystEngComm |
| Year of publication | 2010 |
| Journal volume | 12 |
| Journal issue | 1 |
| Pages of publication | 134 |
| a | 10.7497 ± 0.0007 Å |
| b | 12.5836 ± 0.0008 Å |
| c | 16.4356 ± 0.0011 Å |
| α | 83.842 ± 0.005° |
| β | 83.922 ± 0.005° |
| γ | 78.782 ± 0.005° |
| Cell volume | 2159.9 ± 0.2 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0525 |
| Residual factor for significantly intense reflections | 0.0392 |
| Weighted residual factors for significantly intense reflections | 0.0956 |
| Weighted residual factors for all reflections included in the refinement | 0.1003 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.95 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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