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Information card for entry 7211764
Preview
| Coordinates | 7211764.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C35 H44 Cu N2 O2 P3 S2 |
|---|---|
| Calculated formula | C35 H44 Cu N2 O2 P3 S2 |
| SMILES | [Cu]12([S]=P(OC(C)C)(OC(C)C)N=C(S1)NC)[P](CCC[P]2(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1 |
| Title of publication | Copper(I) complexes with N-thiophosphorylated thioureas and phosphines with versatile structures and luminescence |
| Authors of publication | Babashkina, Maria G.; Safin, Damir A.; Bolte, Michael; Klein, Axel |
| Journal of publication | CrystEngComm |
| Year of publication | 2010 |
| Journal volume | 12 |
| Journal issue | 1 |
| Pages of publication | 134 |
| a | 10.3331 ± 0.0003 Å |
| b | 30.3668 ± 0.0006 Å |
| c | 11.9019 ± 0.0003 Å |
| α | 90° |
| β | 96.807 ± 0.002° |
| γ | 90° |
| Cell volume | 3708.29 ± 0.16 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0272 |
| Residual factor for significantly intense reflections | 0.0257 |
| Weighted residual factors for significantly intense reflections | 0.0633 |
| Weighted residual factors for all reflections included in the refinement | 0.0642 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.072 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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