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Information card for entry 7211859
Preview
| Coordinates | 7211859.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C57.5 H64.25 F12 N9.25 O0.25 P2 Ru |
|---|---|
| Calculated formula | C57.5 H64.25 F12 N9.25 O0.25 P2 Ru |
| Title of publication | Substitution-controlled ultrafast excited-state processes in Ru-dppz-derivatives. |
| Authors of publication | Kuhnt, Christian; Karnahl, Michael; Tschierlei, Stefanie; Griebenow, Kristin; Schmitt, Michael; Schäfer, Bernhard; Krieck, Sven; Görls, Helmar; Rau, Sven; Dietzek, Benjamin; Popp, Jürgen |
| Journal of publication | Physical chemistry chemical physics : PCCP |
| Year of publication | 2010 |
| Journal volume | 12 |
| Journal issue | 6 |
| Pages of publication | 1357 - 1368 |
| a | 16.6339 ± 0.0002 Å |
| b | 17.8896 ± 0.0004 Å |
| c | 23.0113 ± 0.0005 Å |
| α | 99.969 ± 0.001° |
| β | 102.875 ± 0.001° |
| γ | 112.505 ± 0.001° |
| Cell volume | 5907.8 ± 0.2 Å3 |
| Cell temperature | 183 ± 2 K |
| Ambient diffraction temperature | 183 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1382 |
| Residual factor for significantly intense reflections | 0.077 |
| Weighted residual factors for significantly intense reflections | 0.1741 |
| Weighted residual factors for all reflections included in the refinement | 0.2103 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.033 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7211859.html
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