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Information card for entry 7212358
Preview
| Coordinates | 7212358.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C30 H22 Hg I4 N6 Ni |
|---|---|
| Calculated formula | C30 H22 Hg I4 N6 Ni |
| SMILES | [Hg](I)(I)([I-])[I-].[Ni]1234([n]5ccccc5c5[n]1c(ccc5)c1[n]2cccc1)[n]1ccccc1c1[n]3c(ccc1)c1[n]4cccc1 |
| Title of publication | Alternative metal grid structures formed by [M(terpy)2]2+ and [M(terpyOH)2]2+ complexes with small and large tetrahedral dianions, and by [Ru(terpy)2]0 |
| Authors of publication | McMurtrie, John; Dance, Ian |
| Journal of publication | CrystEngComm |
| Year of publication | 2010 |
| Journal volume | 12 |
| Journal issue | 10 |
| Pages of publication | 2700 |
| a | 8.9069 ± 0.001 Å |
| b | 13.303 ± 0.0015 Å |
| c | 14.6187 ± 0.0017 Å |
| α | 81.002 ± 0.002° |
| β | 88.549 ± 0.002° |
| γ | 80.563 ± 0.002° |
| Cell volume | 1687.7 ± 0.3 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.032 |
| Residual factor for significantly intense reflections | 0.0263 |
| Weighted residual factors for significantly intense reflections | 0.0563 |
| Weighted residual factors for all reflections included in the refinement | 0.058 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.07 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7212358.html
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