Information card for entry 7212818

Structure parameters

• Formula: C20 H22 Cu F6 K N2 O4 P
• Calculated formula: C20 H22 Cu F6 K N2 O4 P
• SMILES: [Cu]123[O]4[K]56[O](CC)c7c4c(C=[N]2CC[N]3=Cc2cccc(c2[O]15)[O]6CC)ccc7.[P](F)(F)(F)(F)(F)[F-]
• Title of publication: Tetrametallic [2 ×1 + 1 ×2], octametallic double-decker‒triple-decker [5 ×1 + 3 ×1], hexametallic quadruple-decker and dimetallic-based one-dimensional complexes of copper(ii) and s block metal ions derived from N,N′-ethylenebis(3-ethoxysalicylaldimine)
• Authors of publication: Sasmal, Sujit; Majumder, Samit; Hazra, Susanta; Sparkes, Hazel A.; Howard, Judith A. K.; Nayak, Malabika; Mohanta, Sasankasekhar
• Journal of publication: CrystEngComm
• Year of publication: 2010
• Journal volume: 12
• Journal issue: 12
• Pages of publication: 4131
• a: 7.1687 ± 0.0002 Å
• b: 13.7862 ± 0.0004 Å
• c: 23.3747 ± 0.0006 Å
• α: 90°
• β: 90°
• γ: 90°
• Cell volume: 2310.1 ± 0.11 ų
• Cell temperature: 120 ± 2 K
• Ambient diffraction temperature: 120 ± 2 K
• Number of distinct elements: 8
• Space group number: 19
• Hermann-Mauguin space group symbol: P 21 21 21
• Hall space group symbol: P 2ac 2ab
• Residual factor for all reflections: 0.0477
• Residual factor for significantly intense reflections: 0.0337
• Weighted residual factors for significantly intense reflections: 0.0552
• Weighted residual factors for all reflections included in the refinement: 0.0569
• Goodness-of-fit parameter for all reflections included in the refinement: 0.865
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No