Information card for entry 7212982
| Common name |
Tetraethyl-ET |
| Chemical name |
Bis(1,2-diethyl-ethylenedithio)tetrathiafulvalene |
| Formula |
C18 H24 S8 |
| Calculated formula |
C18 H24 S8 |
| Title of publication |
Tetraalkyl- and dialkyl-substituted BEDT-TTF derivatives and their cation-radical salts: synthesis, structure, and properties |
| Authors of publication |
Kini, Aravinda M.; Parakka, James P.; Geiser, Urs; Wang, Hsien-Hau; Rivas, Felix; DiNino, Ernest; Thomas, Seddon; Dudek, James D.; Williams, Jack M. |
| Journal of publication |
Journal of Materials Chemistry |
| Year of publication |
1999 |
| Journal volume |
9 |
| Journal issue |
4 |
| Pages of publication |
883 |
| a |
13.9032 ± 0.0005 Å |
| b |
13.9032 ± 0.0005 Å |
| c |
23.9326 ± 0.0012 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
4626.1 ± 0.3 Å3 |
| Cell temperature |
298 ± 2 K |
| Ambient diffraction temperature |
298 ± 2 K |
| Number of distinct elements |
3 |
| Space group number |
96 |
| Hermann-Mauguin space group symbol |
P 43 21 2 |
| Hall space group symbol |
P 4nw 2abw |
| Residual factor for all reflections |
0.0819 |
| Residual factor for significantly intense reflections |
0.0501 |
| Weighted residual factors for all reflections |
0.1002 |
| Weighted residual factors for significantly intense reflections |
0.0898 |
| Goodness-of-fit parameter for all reflections |
1.083 |
| Goodness-of-fit parameter for significantly intense reflections |
1.16 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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