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Information card for entry 7213025
Preview
| Coordinates | 7213025.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C21 H42 In N3 O3 S3 |
|---|---|
| Calculated formula | C21 H42 In N3 O3 S3 |
| SMILES | [In]123([S]=C(O1)N(C(C)C)C(C)C)([S]=C(O2)N(C(C)C)C(C)C)[S]=C(O3)N(C(C)C)C(C)C |
| Title of publication | Deposition of tetragonal β-In2S3 thin films from tris(N,N-diisopropylmonothiocarbamato)indium(III), In(SOCNiPr2)3, by low pressure metal-organic chemical vapour deposition |
| Authors of publication | Horley, Graeme A.; O'Brien, Paul; Park, Jin-Ho; White, Andrew J. P.; Williams, David J. |
| Journal of publication | Journal of Materials Chemistry |
| Year of publication | 1999 |
| Journal volume | 9 |
| Journal issue | 6 |
| Pages of publication | 1289 |
| a | 10.716 ± 0.002 Å |
| b | 12.652 ± 0.002 Å |
| c | 12.832 ± 0.004 Å |
| α | 89.17 ± 0.02° |
| β | 66.16 ± 0.02° |
| γ | 66.034 ± 0.011° |
| Cell volume | 1430.6 ± 0.7 Å3 |
| Cell temperature | 183 ± 2 K |
| Ambient diffraction temperature | 183 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0563 |
| Residual factor for significantly intense reflections | 0.0416 |
| Weighted residual factors for all reflections | 0.1024 |
| Weighted residual factors for significantly intense reflections | 0.0944 |
| Goodness-of-fit parameter for all reflections | 1.035 |
| Goodness-of-fit parameter for significantly intense reflections | 1.065 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7213025.html
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Users of the data should acknowledge the original authors of the
structural data.