Information card for entry 7213370
| Chemical name |
compound 3f |
| Formula |
C26 H28 O S |
| Calculated formula |
C26 H28 O S |
| SMILES |
[C@@]12(C3(CC3)C3(CC3)[C@](C(=C1Cc1ccccc1)Cc1ccccc1)(S2=O)C)C |
| Title of publication |
[4 + 2] Cycloaddition of thiophene S-monoxides to activated methylenecyclopropanes |
| Authors of publication |
Thiemann, Thies; Ohira, Daisuke; Li, Yuanqiang; Sawada, Tsuyoshi; Mataka, Shuntaro; Rauch, Karsten; Noltemeyer, Mathias; de Meijere, Armin |
| Journal of publication |
Journal of the Chemical Society, Perkin Transactions 1 |
| Year of publication |
2000 |
| Journal issue |
17 |
| Pages of publication |
2968 |
| a |
13.131 ± 0.002 Å |
| b |
14.125 ± 0.002 Å |
| c |
11.6791 ± 0.0014 Å |
| α |
90° |
| β |
97.061 ± 0.012° |
| γ |
90° |
| Cell volume |
2149.8 ± 0.5 Å3 |
| Cell temperature |
150 ± 2 K |
| Ambient diffraction temperature |
150 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0553 |
| Residual factor for significantly intense reflections |
0.0419 |
| Weighted residual factors for all reflections |
0.1072 |
| Weighted residual factors for significantly intense reflections |
0.093 |
| Goodness-of-fit parameter for all reflections |
1.083 |
| Goodness-of-fit parameter for significantly intense reflections |
1.067 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/7213370.html