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Information card for entry 7215330
Preview
| Coordinates | 7215330.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C16 H24 Cl4 N2 Zn |
|---|---|
| Calculated formula | C16 H24 Cl4 N2 Zn |
| SMILES | c1c(cccc1)CC[NH3+].C(C[NH3+])c1ccccc1.[Zn](Cl)(Cl)([Cl-])[Cl-] |
| Title of publication | Robust motifs in 2-phenylethylammonium and related tetrahalometallates |
| Authors of publication | Rademeyer, Melanie; Tsouris, Christos; Billing, David G.; Lemmerer, Andreas; Charmant, Jonathan |
| Journal of publication | CrystEngComm |
| Year of publication | 2011 |
| Journal volume | 13 |
| Journal issue | 10 |
| Pages of publication | 3485 |
| a | 7.432 ± 0.014 Å |
| b | 24.68 ± 0.03 Å |
| c | 11.157 ± 0.018 Å |
| α | 90° |
| β | 91.7 ± 0.14° |
| γ | 90° |
| Cell volume | 2046 ± 6 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.1298 |
| Residual factor for significantly intense reflections | 0.0728 |
| Weighted residual factors for significantly intense reflections | 0.2 |
| Weighted residual factors for all reflections included in the refinement | 0.226 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.104 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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