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Information card for entry 7215813
Preview
| Coordinates | 7215813.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C44 H26 F4 N8 O4 |
|---|---|
| Calculated formula | C44 H26 F4 N8 O4 |
| SMILES | c1(cccc(c1)C[n+]1ccc2ccccc2c1)N(=O)=O.FC1C(=C(C#N)C#N)C(F)=C(F)C(=C(C#N)C#N)C=1F.c1(cccc(c1)C[n+]1cc2c(cc1)cccc2)N(=O)=O |
| Title of publication | Structural and optical investigations of charge transfer complexes involving the F4TCNQ dianion |
| Authors of publication | Sutton, Ashley L.; Abrahams, Brendan F.; D'Alessandro, Deanna M.; Elliott, Robert W.; Hudson, Timothy A.; Robson, Richard; Usov, Pavel M. |
| Journal of publication | CrystEngComm |
| Year of publication | 2014 |
| a | 9.1726 ± 0.0005 Å |
| b | 10.6903 ± 0.0006 Å |
| c | 10.7126 ± 0.0006 Å |
| α | 73.15 ± 0.005° |
| β | 80.841 ± 0.005° |
| γ | 64.809 ± 0.005° |
| Cell volume | 908.96 ± 0.1 Å3 |
| Cell temperature | 130 ± 2 K |
| Ambient diffraction temperature | 130 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0457 |
| Residual factor for significantly intense reflections | 0.0404 |
| Weighted residual factors for significantly intense reflections | 0.1051 |
| Weighted residual factors for all reflections included in the refinement | 0.1092 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.088 |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7215813.html
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structural data.