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Information card for entry 7215817
Preview
| Coordinates | 7215817.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C40 H38 F4 N8 |
|---|---|
| Calculated formula | C40 H38 F4 N8 |
| SMILES | C(#N)C(C#N)=C1C(F)=C(C(=C(C#N)C#N)C(=C1F)F)F.c1(cccc2c1c(N(C)C)ccc2)[NH+](C)C.c1(cccc2cccc(N(C)C)c12)[NH+](C)C |
| Title of publication | Structural and optical investigations of charge transfer complexes involving the F4TCNQ dianion |
| Authors of publication | Sutton, Ashley L.; Abrahams, Brendan F.; D'Alessandro, Deanna M.; Elliott, Robert W.; Hudson, Timothy A.; Robson, Richard; Usov, Pavel M. |
| Journal of publication | CrystEngComm |
| Year of publication | 2014 |
| a | 8.6578 ± 0.0007 Å |
| b | 9.6463 ± 0.0006 Å |
| c | 11.6657 ± 0.0007 Å |
| α | 109.413 ± 0.006° |
| β | 101.096 ± 0.006° |
| γ | 92.685 ± 0.006° |
| Cell volume | 895.22 ± 0.11 Å3 |
| Cell temperature | 130 ± 2 K |
| Ambient diffraction temperature | 130 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.056 |
| Residual factor for significantly intense reflections | 0.0473 |
| Weighted residual factors for significantly intense reflections | 0.1244 |
| Weighted residual factors for all reflections included in the refinement | 0.1334 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.029 |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7215817.html
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Users of the data should acknowledge the original authors of the
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