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Information card for entry 7215819
Preview
| Coordinates | 7215819.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C24 H14 F4 N6 |
|---|---|
| Calculated formula | C24 H14 F4 N6 |
| SMILES | c1(cc[n+](C)cc1)c1cc[n+](C)cc1.C1(F)C(C(=C(C(C=1F)=C(C#N)C#N)F)F)=C(C#N)C#N |
| Title of publication | Structural and optical investigations of charge transfer complexes involving the F4TCNQ dianion |
| Authors of publication | Sutton, Ashley L.; Abrahams, Brendan F.; D'Alessandro, Deanna M.; Elliott, Robert W.; Hudson, Timothy A.; Robson, Richard; Usov, Pavel M. |
| Journal of publication | CrystEngComm |
| Year of publication | 2014 |
| a | 11.375 ± 0.0003 Å |
| b | 7.1927 ± 0.0002 Å |
| c | 12.4527 ± 0.0003 Å |
| α | 90° |
| β | 93.83 ± 0.002° |
| γ | 90° |
| Cell volume | 1016.57 ± 0.05 Å3 |
| Cell temperature | 130 ± 2 K |
| Ambient diffraction temperature | 130 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0377 |
| Residual factor for significantly intense reflections | 0.033 |
| Weighted residual factors for significantly intense reflections | 0.0882 |
| Weighted residual factors for all reflections included in the refinement | 0.0917 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.07 |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7215819.html
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